Practical Surface Analysis 2.

Fülszöveg

PRACTICAL SURFACE ANALYSIS SECOND EDITION
VOLUME 2 - Ion and Neutral Spectroscopy
Edited by
D. Briggs, id PLC, Wilton Research Centre, Wilton, l\/liddlesbrough, Cleveland, UK and
M. P. Seah, Division of Materials Metrology, National Physical Laboratory, Teddington, Middlesex, UK
This multi-author volume is a companion to Practical Surface Analysis (Second Edition) Volume 1: Auger and X-ray Photoelectron Spectroscopy which was published in 1990. Volume 2 reflects the rapid evolution of surface analysis techniques involving ion and neutral spectroscopies since the publication of the first edition (dealing only with AES and XPS) in 1983. In completing this two-volume set, the editors provide a thorough coverage of the techniques currently employed in surface analysis.
Sputtering techniques are comprehensively discussed in seven chapters covering the instrumentation, theory, quantification, dynamic and static SIMS, SNMS and applications. Two further chapters cover low and medium... Tovább

Fülszöveg

PRACTICAL SURFACE ANALYSIS SECOND EDITION
VOLUME 2 - Ion and Neutral Spectroscopy
Edited by
D. Briggs, id PLC, Wilton Research Centre, Wilton, l\/liddlesbrough, Cleveland, UK and
M. P. Seah, Division of Materials Metrology, National Physical Laboratory, Teddington, Middlesex, UK
This multi-author volume is a companion to Practical Surface Analysis (Second Edition) Volume 1: Auger and X-ray Photoelectron Spectroscopy which was published in 1990. Volume 2 reflects the rapid evolution of surface analysis techniques involving ion and neutral spectroscopies since the publication of the first edition (dealing only with AES and XPS) in 1983. In completing this two-volume set, the editors provide a thorough coverage of the techniques currently employed in surface analysis.
Sputtering techniques are comprehensively discussed in seven chapters covering the instrumentation, theory, quantification, dynamic and static SIMS, SNMS and applications. Two further chapters cover low and medium energy ion scattering. Six appendices deal with angular resolved electron stimulated desorption, important computer programs, SIMS standards and a variety of useful reference data.
As with Volume 1, all the contributors are internationally recognized as experts in their respective fields and come from both Europe and the USA.
Reviews of the first volume:
' the reviewer has no hesitation in recommending this edition to practical and theoretical surface spectroscopists and to those in industry who desire better qualitative and quantitative surface characterization of their products. It is hoped that the covers of this edition are strong enough to withstand the constant usage that it is likely
to encounter.' _ , ,
Talanta
' the book stands as a milestone in surface analysis literature.'
Spectroscopy World
ISBN 0-4 71 - 920 82-7 Vissza